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T S Zheleva


Click on the titles below to find US government-authored or -collected reports written by T S Zheleva

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Growth of Low Defect Density Gallium Nitride (GaN) Films on Novel Tantalum Carbide (TaC) Substrates for Improved Device Performance May-2009 34 pages
Authors:  M A Derenge; K A Jones; K W Kirchner; T S Zheleva; R D Vispute; ARMY RESEARCH LAB ADELPHI MD SENSORS AND ELECTRON DEVICES DIRECTORATE
The full text of this report is available for sale.To potentially improve device performance, we attempted to grow gallium nitride (GaN) films with better crystalline quality (fewer mismatch dislocations) using a tantalum carbide (TaC) substrate, which is more closely lattice matched to GaN than currently used substrates. We created the TaC substrate, using pulse laser deposition (PLD) of TaC onto (0001) SiC substrates at tilde 1000 deg C, and grew GaN films, using metal organic chemical vapor deposition (MOCVD). ...


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