This study has addressed the use of built-in-test (BIT) for fault detection, isolation, and repair in the Military Computer Family (MCF). Particular emphasis was given to the identification and assessment of BIT techniques applicable to the MCF-AN/UYK-41(V). The MCF-AN/UYK-41(V) is software compatible with Digital Equipment Corporation's PDP-11/70. The approach taken in this study was to assume a fault population, predict where in the system these faults are most likely to ...
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