The design of monolithic microwave integrated circuits (MMIC) is dependent on the ability to generate accurate device models. Prior knowledge of the external parasitic components is required to determine the small-signal model of the intrinsic device. In this report, we describe a technique and its implementation for extracting external device parasitics. The term cold field-effect transistor (FET) refers to measurements taken when the drain is at the same voltage as ...
We present a new procedure to generate additional features for system diagnosis. The procedure is based on empirical mode decomposition of measured signals obtained by monitoring the relevant state of a system. This procedure is different from the existing procedures for defining features, which are generally obtained using the statistics of the measured signal, the matched filter outputs, and the wavelet decomposition of measured signals. Features derived by this new ...
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