| Single Event Upset and Latchup Considerations for CMOS Devices Operated at 3.3 Volts |
15 JAN 1998 |
8 pages |
| Authors:
R. Koga; S. J. Hansel; W. R. Crain; K. B. Crawford; S. D. Pinkerton; J. Quan; M. Maher; AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS
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 | A comparison of single event upset and latchup test results for devices operated at several bias levels, from 2.5 V to 6 V, is reported. Vulnerability to SEU increased with decreasing bias, whereas the opposite pattern was observed for SEL. The relationship between threshold SEU vulnerability and bias is not regular, which precludes the use of simple prediction schemes for obtaining the expected vulnerability at 3.3 V from existing 5 ... |
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| Observation of Single Event Upsets in Analog Microcircuits |
15 JAN 1998 |
11 pages |
| Authors:
R. Koga; S. D. Pinkerton; S. C. Moss; D. C. Mayer; S. LaLumondiere; S. J. Hansel; AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS
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| Selected analog devices were tested for heavy ion induced single event upset (SEU). The results of these tests are presented, likely upset mechanisms are discussed, and standards for the characterization of analog upsets are suggested. The OP-15 operational amplifier, which was found to be susceptible to SEU in the laboratory, has also experienced upset in space. Possible strategies for mitigating the occurrence of analog SEUs in space are discussed. ... |
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| Low Dose Rate Proton Irradiation of Quartz Crystal Resonators |
15 JAN 1998 |
12 pages |
| Authors:
R. Koga; M. D. Looper; S. D. Pinkerton; W. J. Stapor; AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS
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| Quartz crystal resonators were systematically irradiated with 65 MeV protons to characterize low dose rate radiation-induced degradation. Results indicate: (1) test samples that exhibit large frequency shifts during testing tend to show large frequency shifts prior to irradiation, or during off- irradiation periods; (2) for radiation-sensitive samples, short-term effects seem to decrease after each irradiation on/off cycle (moreover, those devices in which radiation effects do not decrease after a few ... |
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| Single-Word Multiple-Bit Upsets in Static Random Access Devices |
15 JAN 1998 |
10 pages |
| Authors:
R. Koga; S. D. Pinkerton; T. J. Lie; K. B. Crawford; AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS
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| Space-borne electronics systems incorporating high-density static random access memory (SRAM) are vulnerable to single-word multiple-bit upsets (SMUs). We review here recent observations of SMU, present the results of a systematic investigation of the physical cell arrangements employed in several currently available SRAM device types, and discuss implications for the occurrence and mitigation of SMU. |
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| The Impact of ASIC Devices on the SEU Vulnerability of Space-Borne Computers |
30 JAN 94 |
14 pages |
| Authors:
R. Koga; W. R. Crain; K. B. Crawford; S. J. Hansel; S. D. Pinkerton; AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS
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| Application specific integrated circuits (ASICs) offer a number of advantages over traditional multi-component microcircuits including reductions in both size and power dissipation, and are therefore prime candidates to replace such microcircuits in space-borne electronics systems. The results of recent tests of the susceptibilities of various ASIC devices to cosmic ray and trapped proton induced single event upset (SEU) and latchup are reported here and are compared to the susceptibilities of ... |
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| Data Processing Algorithms for On-Board Satellite Event Analysis |
30 JAN 94 |
13 pages |
| Authors:
R. Koga; S. D. Pinkerton; N. Katz; AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS
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| Event rates encountered by satellite-borne sensors typically exceed the available telemetry bandwidth, necessitating on-board data analysis. One method of reducing output telemetry requirements, employed by data processing units (DPUs) on several recent and forthcoming satellites (VIKING, CRRES, CAMMICE) is to partition the underlying event parameter spaces into disjoint classes, and to downlink statistics based on these classes rather than individual events. The DPUs utilize a hardware implemented binary search algorithm ... |
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| Data Processing Units for Eight Magnetospheric Particle and Field Sensors |
29 JAN 93 |
10 pages |
| Authors:
R. Koga; S. S. Immamoto; N. Katz; S. D. Pinkerton; AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS
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| The DPUA, DPUB, and DPU57 data processing units associated with eight CRRES particle and field experiments are described. Operation of the experiments is controlled by the data processing units (DPUs), which constitute the interface between the spacecraft and the sensors subserving the individual experiments. All data to and from the sensors pass through the associated DPUs. Each DPU consists of a microprocessor, power supply, signal handler, and various peripherals such ... |
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| On the Suitability of Non-Hardened High Density SRAMs for Space Applications |
16 JUL 92 |
27 pages |
| Authors:
R. Koga; W. R. Crain; D. D. Lau; S. D. Pinkerton; B. K. Yi; AEROSPACE CORP EL SEGUNDO CA ENGINEERING AND TECHNOLOGY GROUP
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| Several non-radiation-hardened high density static RAMs (SRAMs) were tested for susceptibility to single-event upset (SEU) and (latchup). Test results indicated that at present only a few such device types are suitable for use in space applications. Several additional factors such as susceptibility to multiple-bit upsets and to radiation-induced permanent damage need to be taken into consideration before these device types can be recommended. One non- hardened SRAM device type has ... |
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| Bevalac Ion Beam Characterizations for Single Event Phenomena |
16 JUL 92 |
20 pages |
| Authors:
R. Koga; N. Katz; S. D. Pinkerton; W. A. Kolasinski; D. L. Oberg; AEROSPACE CORP EL SEGUNDO CA ENGINEERING AND TECHNOLOGY GROUP
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| Linear Energy Transfer (LET) distributions of Bevalac ion beams were measured. Subsequent analysis has called into question the standard assumption of a monoenergetic, single-species beam at Bevalac. Both high LET contaminants in the primary beam and very broad LET peaks in degraded beams were observed. High energy ion beams at other accelerators may possess similar characteristics. The existence of beam impurities may have important ramifications for the interpretation of single-event ... |
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| Bevalac Ion Beam Characterizations for Single Event Phenomena |
16 JUL 92 |
23 pages |
| Authors:
R. Koga; N. Katz; S. D. Pinkerton; W. A. Kolasinski; D. L. Oberg; AEROSPACE CORP EL SEGUNDO CA SPACE AND ENVIRONMENTAL TECHNOLOGY CENTER
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| Linear Energy Transfer (LET) distributions of Bevalac ion beams were measured. Subsequent analysis has called into question the standard assumption of a monoenergetic, single-species beam at Bevalac. Both high LET contaminants in the primary beam and very broad LET peaks in degraded beams were observed. High energy ion beams at other accelerators may possess similar characteristics. The existence of beam impurities may have important ramifications for the interpretation of single-event ... |
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