Patrick J. McKeown - Storming Media

Visualization of a Buried Organic Interface by Imaging TOF-SIMS and Scanning Auger Microprobe of an Ion Beam Crater Edge

SEP 94

56 pages

Authors: Patrick C. Schamberger; Gary L. Jones; Joseph A. Gardella Jr.; Patrick J. McKeown; Larry B. Davis; STATE UNIV OF NEW YORK AT BUFFALO DEPT OF CHEMISTRY

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A method has been developed for chemically imaging a buried organic interface of thickness similar to that of a biological conditioning film. Using an ion beam to form a sputter crater, elemental analysis of the edge of the crater is performed using Auger Electron Spectroscopy (AES) and chemical imaging of the edge is performed by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS). The crater edge that is formed due to the ...