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R. Liu


Click on the titles below to find US government-authored or -collected reports written by R. Liu

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Pitch Angle Diffusion of Low-Energy Electrons by Whistler Mode Waves, 10 JUN 1993
Authors:  A. D. Johnstone; D. M. Walton; R. Liu; D. A. Hardy; PHILLIPS LAB HANSCOM AFB MA
The full text of this report is not available and therefore is not for sale. This information is provided for reference purposes only.It has often been argued that electrons with energy below appoximately 10 keV cannot be pitch-angle diffused by whistler mode waves because they have less than a critical minimum parallel energy. We show that there is no theoretical justification for an energy threshold based on the grounds of either resonance or instability and present energy/pitch angle plots from the low energy plasma analyzer (LEPA) on the CRRES spacecraft which support ...


Accessibility of Large-Scale Electronic Circuits, 20 MAR 1978
Authors:  R. Liu; V. Visvanathan; C. Lin; NOTRE DAME UNIV IN
The full text of this report is not available and therefore is not for sale. This information is provided for reference purposes only.The problem of fault diagnosis of large-scale analog circuit is studied. Any fault diagnosis procedure is limited by the number of circuit parameters to be diagnosed. When such limit is exceeded by large-scale circuits, some kind of tearing process has to be implemented before a fault diagnosis procedure can be applied. In this paper, a tearing process via accessibility of subnetworks is presented. The necessary and sufficient condition for accessibility ...


REFRACTORY MATERIAL STANDARDS. SEP 1965
Authors:  S. Kallmann; J. Wieland; F. Collier; R. Liu; H. Oberthin; LEDOUX AND CO INC TEANECK NJ
The full text of this report is not available and therefore is not for sale. This information is provided for reference purposes only.Oxide standards of zirconium, hafnium, titanium, yttrium, niobium, and aluminum containing prescribed impurity elements in three different concentration ranges were prepared and subsequently analyzed by chemical, spectrographic, and in some cases, neutron activation techniques. Impurity elements incorporated in the standards are boron, calcium, chromium, iron, magnesium, manganese, nickel, silicon, sodium, tantalum, tungsten; and where applicable, aluminum, hafnium, titanium, and zirconium. The three ranges of impurity concentration in parts per million ...


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