| Proceedings of the 1980 ERADCOM Hybrid Microcircuit Symposium, 1980, Fort Monmouth, New Jersey, |
JUN 1980 |
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| Authors:
Owen P. Layden; Isaac H. Pratt; ARMY ELECTRONICS RESEARCH AND DEVELOPMENT COMMAND FORT MONMOUTH NJ ELECTRONICS TECHNOLOGY/DEVICES LAB
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 | These papers discuss application of hybrid microcircuits in government communications, surveillance and other military electronics equipment. Military use of hybrid microcircuits, past and future were described along with microwave techniques, and progress in film technology and tape processing. Included are papers on advanced processing and manufacturing, new packaging techniques and manufacturing/quality controls. (Author) |
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| Mechanical Acceleration Multiplier for Microcircuit Bond Testing. |
13 MAR 1979 |
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| Authors:
Owen P. Layden; Francis J. Murdoch; DEPARTMENT OF THE ARMY WASHINGTON DC
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| This patent discloses a mechanical acceleration multiplier for testing the bond strength of an adhesive wherein the adhesive to be tested is subjected to centrifugal force. |
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| NEWLY DEVELOPED CRYSTAL MEASUREMENT INSTRUMENTS. |
AUG 1968 |
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| Authors:
Owen P. Layden; Arthur D. Ballato; Charles L. Shibla; ARMY ELECTRONICS COMMAND FORT MONMOUTH N J
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| This report is concerned with two crystal measurement instruments that have recently been developed. The first of these instruments is the Crystal Impedance (C.I.) Meter System covering the frequency range .8 to 20 MHz developed by Piezo Technology, Inc. This instrument is an outgrowth of the C. I. Meter, which has been in use for years, and it uses the C. I. Meter oscillator circuit as the heart of the ... |
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| CRYSTAL OSCILLATOR APPLICATION GUIDE, |
JUL 1963 |
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| Authors:
Owen P. Layden; ARMY ELECTRONICS LABS FORT MONMOUTH N J
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| This report serves as a guide in the proper use of the quartz crystal in oscillator circuits. It outlines the important aspects of crystal use, such as type of operation, drive, and load impedance, and discusses the frequency errors introduced by improper circuit design. Separate sections are devoted to the crystal, circuits, and measurements on these devices. (Author) |
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