This report summarizes work done on the reliability analysis and design of VLSI circuits. Many reliability issues, such as electromigration in metal lines and hot-carrier effects (HCE) induced degradation in devices, are related to the statistics of the average current flow in the circuit and devices. New techniques for current estimation in synchronous sequential circuits have been developed and implemented. Given primary input statistics, mixed statistical Monte Carlo and probabilistic ...
This effort emphasizes the computation of the average and variance current density waveforms in the metal buses for estimating the MTF for electromigration effects. That effort is composed of two parts: The probabilistic simulation methods and software for computing the statistics of the current waveform at contact points to the buses; and the accurate extraction of the equivalent RC model of the bus for analyzing the bus currents. In addition, ...
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