| Enabling Robust C2 Systems through Evolvable Human-in-the-Loop Data Fusion |
Jun-2009 |
30 pages |
| Authors:
Eric Carlson; Emilie Roth; Jonathan Pfautz; Gerald Powell; Sean Guarino; Samuel Mahoney; Ted Fichtl; Mike Farry; CHARLES RIVER ANALYTICS INC CAMBRIDGE MA
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 | Data fusion systems are being increasingly used to support military planning, decision making, and command and control functions in general. Typically, these systems are designed around the current capabilities of particular data collectors (e.g., sensors) and available processing algorithms. These algorithms incorporate an ontology that reflects the designer's perception of key concepts in the world (e.g., types of threats, classes of vehicles to be tracked) and how these can be ... |
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| Q2 Known Good Substrates Technical Report |
05-May-2009 |
11 pages |
| Authors:
Eric Carlson; Mark Loboda; Gilyong Chung; Rebecca Lauer; DOW CORNING CORP MIDLAND MI
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| The Known Good Substrates (KGS) Phase III program was initiated 29 September 2008. Wafer, epitaxy, modeling and metrology work has been the main focus of efforts in Q2. This technical report summarizes the progress by all team members against the tasks and milestones. |
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| Q2 Known Good Substrates |
27 MAR 2008 |
10 pages |
| Authors:
Mark Loboda; Eric Carlson; Gilyong Chung; Brian Russell; DOW CHEMICAL CO MIDLAND MI
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| The Known Good Substrates (KGS) Phase II program was initiated 29 August 2007. Wafer, epitaxy, modeling and metrology work has been the main focus of efforts in Q2. This technical report summarizes the progress by all team members against the tasks and milestones. |
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| Known Good Substrates Year 1 |
05 DEC 2007 |
61 pages |
| Authors:
Mark Loboda; Eric Carlson; Gilyong Chung; Brian Russell; DOW CORNING COMPOUND SEMICONDUCTOR SOLUTIONS LLC MIDLAND MI
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| The Known Good Substrates (KGS) Phase I program is complete. Results are reported for the entire program, including subcontractor activities. |
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| Q5 Known Good Substrates |
27 FEB 2007 |
9 pages |
| Authors:
Mark Loboda; Eric Carlson; Gilyong Chung; Brian Russell; DOW CORNING COMPOUND SEMICONDUCTOR SOLUTIONS LLC MIDLAND MI
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| The Known Good Substrates (KGS) program is on track technically and financially with program tasks. A no-cost time extension was processed from February to March 31, 2007. The remaining Q3 and Q4 wafers were delivered after a delay due to equipment down time. Q4 wafer metrology and characterization was completed. Results are reported from first device fabrication lots. Many subcontractors are ramping down activities as their work nears completion. |
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| Q4 Known Goods Substrates Technical Report |
02 DEC 2006 |
10 pages |
| Authors:
Mark Loboda; Eric Carlson; Gilyong Chung; Brian Russell; SEMICONDUCTOR SOLUTIONS LLC MIDLAND MI
|
| The Known Good Substrates (KGS) program is on track technically and financially with program tasks. Q4 wafer fabrication will be completed on time, Q4 metrology and characterization was completed, and Q3 wafers were distributed to partners early in Q4. Many subcontractors are ramping down activities as their work nears completion. A full program review meeting was held in December 2006. |
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| Q2 Known Goods Substrates Technical Report |
15 SEP 2006 |
9 pages |
| Authors:
Mark Loboda; Eric Carlson; Gilyong Chung; Brian Russell; DOW CORNING COMPOUND SEMICONDUCTOR SOLUTIONS LLC MIDLAND MI
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| The Known Good Substrates (KGS) program is on track technically and financially with program tasks. Q3 wafer fabrication will be completed on time, Q3 metrology and characterization was completed, and Q2 wafers were distributed to partners early in Q3. All subcontracts are in place and many subcontractors are ramping up activities with wafers coming out of the Q1 and Q2 wafer fabrication. |
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| Q2 Known Goods Substrates |
02 JUN 2006 |
7 pages |
| Authors:
Mark Loboda; Eric Carlson; Gilyong Chung; Brian Russell; DOW CORNING CORP MIDLAND MI
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| The Known Good Substrates (KGS) program is on track technically and financially with program tasks. Q1 wafer fabrication was completed, Q1 metrology and characterization was completed, and wafers were distributed to partners. All but 1 subcontract is in place and many subcontractors are ramping up activities with wafers coming out of the Q1 wafer fabrication. |
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| Density Imaging Diagnostic for Plasma Radiation Sources |
28 SEP 2005 |
71 pages |
| Authors:
Edward J. Yadlowsky; Eric Carlson; Farid Barakat; Robert C. Hazelton; HY-TECH RESEARCH CORP RADFORD VA
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| A technique to determine the radial distributions of the electron density and temperature in a plasma radiation source (PRS) from radially resolved spectra of optically thin dopants is described herein. A space and time resolved Johann spectrometer and a version with a modified high spectral resolution film circle were constructed for this purpose. The observed values for the temperature sensitive Ly(sub a) and He(sub a) plus intercombination (IC) line intensity ... |
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