| Optical Darkening During Space Environmental Effects Testing - Contaminant Film Analyses |
30 SEP 2004 |
16 pages |
| Authors:
P. D. Fuqua; B. A. Morgan; P. M. Adams; M. J. Meshishnek; AEROSPACE CORP EL SEGUNDO CA ENGINEERING AND TECHNOLOGY GROUP
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 | As a part of a space environmental effects test, two samples used as contamination monitors exhibited slight darkening. Analysis by ellipsometry indicates that l2oA of highly absorptive material had been deposited on them. Static SIMS confirms that a contaminant material was deposited during the test. It further suggests that the contaminant film is composed of polymerized silicones and hydrocarbons. An attempt to use grazing-angle FTIR spectroscopy to identify the film ... |
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| Burst Testing of Filament-Wound Graphite-Epoxy Composite Cylindrical Tubes |
01 NOV 2002 |
80 pages |
| Authors:
D. J. Chang; H. A. Katzman; J. P. Nokes; P. M. Adams; S. T. Amimoto; AEROSPACE CORP EL SEGUNDO CA LAB OPERATIONS
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| An experimental and analytical program was performed to elucidate the failure process of filament-wound graphite-epoxy tubes, especially the effects of wrinkled fibers and of proof testing on tube burst strength. Four types of tubes were tested: those free of flaws, those with a minor or severe helical wrinkle, and those with a hoop wrinkle. Tests included pressurization to burst, and single or multiple proof tests followed by burst. Data collection ... |
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| Examination of Suspected Delta II Second-Stage Reentry Debris |
15 JUL 2001 |
25 pages |
| Authors:
P. M. Adams; W. H. Kao; AEROSPACE CORP EL SEGUNDO CA LAB OPERATIONS
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| A piece of suspected reentry debris was submitted to the Materials Science Department for analysis to determine whether its composition was consistent with its supposed source. The debris consisted of a black-colored woven fabric that locally had clear fused-looking areas, with entrapped bubbles, and small metallic deposits. The time and location of the recovered debris correspond with the reentry of a Delta II second stage. The second-stage fuel tank, thrust ... |
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| Characterization of High Thermal Conductivity Carbon Fibers and a Self- Reinforced Graphite Panel |
01 SEP 1998 |
19 pages |
| Authors:
P. M. Adams; H. A. Katzman; G. S. Rellick; G. W. Stupian; AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS
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| Extremely high thermal conductivity graphitic materials from mesophase pitch precursors (K-1100 fibers, four experimental high thermal conductivity fibers, and a ThermalGraph(R) panel) were examined utilizing X-ray diffraction (XRD) and high-resolution field emission (FE) scanning electron microscopy (SEM). Of the four experimental fibers, two were produced from Amoco's standard petroleum pitch, and two were produced from an Amoco experimental pitch precursor. The low d-spacings, ... |
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| Fiber-Matrix Interphase Development in Carbon/Carbon Composites |
15 JAN 98 |
15 pages |
| Authors:
G. S. Rellick; R. J. Zaldivar; P. M. Adams; AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS
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| In carbon/carbon (C/C) composites-i.e., a composite in which a carbon matrix is reinforced with carbon fiber when the matrix is derived from a thermosetting resin, we always observe a distinct, highly graphitizable, and well-oriented matrix interphase structure adjacent to the fibers. Qualitatively, the orientation of the interphase is the same as the fiber. It is important to note that thermosetting resins are non-graphitizing when heated in bulk; ... |
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| Evaluation of the Quality of Sapphire Using X-Ray Rocking Curves and Double-Crystal X-Ray Topography |
01 MAY 94 |
23 pages |
| Authors:
P. M. Adams; AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS
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| Single-crystal sapphire is a material with a wide range of applications as a result of its unique physical, optical, mechanical, and chemical properties. The quality of a sapphire crystal can influence its effectiveness in many applications. High-quality, near-perfect, single-crystal sapphire can be grown, but it is difficult to shape and polish because of its extreme hardness, and surface flaws and damage are commonly produced during fabrication. Since this damage may ... |
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| Procedures for the Preparation of Samples for Cross-Sectional Transmission Electron Microscopy |
06 AUG 90 |
36 pages |
| Authors:
S. Y. Teng; P. M. Adams; AEROSPACE CORP EL SEGUNDO CA MATERIALS SCIENCES LAB
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| Cross sectional transmission electron microscopy (XTEM) is an important technique for studying the morphology and local chemistry of the interfaces of thin film materials. The preparation of samples for XTEM analysis can be summarized as follows: Samples are cleaved or sawed into 2 mm x 7 mm strips. A sandwich consisting of four strips is glued together. 50-mil thick slices are cut from the sandwich. The slices are ground and ... |
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| Ion Mixing of Ti and TiO(y) Films on SiO(x) |
04 NOV 88 |
30 pages |
| Authors:
A. A. Galuska; J. C. Uht; P. M. Adams; J. M. Coggi; AEROSPACE CORP EL SEGUNDO CA MATERIALS SCIENCES LAB
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| The influence of ion implantation on the interfacial chemistry, morphology, and adhesion of Ti and TiOy films on Siox was examined. The Ti/SiOx and TiOy/SiOx specimens were implanted with varying doses of 84Kr+ at different substrate temperatures (2 x 10 to the 16th Kr/sq. cm at 70 C, 1 x 10 to the 17th Kr/sq. cm. at 70 C, and 1 x 10 to the 17th Kr/sq. cm. at 350 ... |
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| Use of Rutherford Backscattering and Optical Spectroscopy to Study Boron Implantation in Cadmium Telluride |
03 OCT 88 |
21 pages |
| Authors:
D. N. Jamieson; R. C. Bowman Jr.; P. M. Adams; J. F. Knudsen; R. G. Downing; AEROSPACE CORP EL SEGUNDO CA
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| The effect of large dose boron implantation in single crystal cadmium telluride (CdTe) has been investigated by Rutherford backscattering spectrometry (RBS), with channeling double crystal x-ray diffraction (DCD), and photoreflectance (PR) spectroscopy. Comparisons are made with the results of identical B implantations of Silicon and Gallium Arsenides crystals. Multiple energy implantations were performed at room temperature and liquid nitrogen temperature with total doses up to 1.5 x 10 to the ... |
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| Optical and Structural Characteristics of Heavily Boron-Implanted CdTe |
24 MAY 88 |
30 pages |
| Authors:
R. C. Bowman Jr.; R. L. Alt; P. M. Adams; J. F. Knudsen; D. M. Jamieson; AEROSPACE CORP EL SEGUNDO CA LAB OPERATIONS
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| Cadmium telluride single crystals were subjected to multiple-energy boron ion implants with total doses up to 1.5 x 10 sq cm. Various diagnostic techniques were used to assess the structural and electronic properties of these crystals in their as-implanted condition and after anneals under vacuum. The degradation of crystallinity following the boron implants was clearly evident. Annealing temperatures up to 500 C were not effective removing the damage from these ... |
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| Thin Film-Residual Stress Assessment |
12 FEB 88 |
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| Authors:
D. J. Chang; R. Muki; P. M. Adams; K. W. Paschen; C. Tseng; AEROSPACE CORP EL SEGUNDO CA MATERIALS SCIENCES LAB
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 | That residual stresses exist in thin-film coated structures has been known for decades. Their existence plays an important role in the ability of coated structures to withstand external loads which might arise from mechanical, thermal, electrical and optical environments. Magnitudes of the residual stresses are influenced by many factors. These include mechanical properties of the films and substrates, mismatch of the thermal expansion between films and substrates, processing parameters such ... |
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| Analysis of Component Contamination from Accelerated Contamination Testing of Five-Year Vuilleumier Cryocooler |
05 FEB 87 |
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| Authors:
D. C. Cranmer; E. J. Watts; G. A. To; N. Marquex; P. M. Adams; AEROSPACE CORP EL SEGUNDO CA MATERIALS SCIENCES LAB
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| Unit S2 of the Vuilleumier Cryocooler Program has undergone accelerated contamination testing at twice the service speed and approximately three times the service pressure expected in a normal unit. Debris samples were obtained from all areas of the cooler; samples of regenerator balls were collected from the second and third stages only. The debris has been characterized by an investigative analysis using the analytical techniques of X ray diffraction, Fourier ... |
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| Hillock Formation on (100) GaAs |
27 NOV 85 |
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| Authors:
S. I. Boldish; P. M. Adams; AEROSPACE CORP EL SEGUNDO CA ELECTRONICS RESEARCH LAB
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| For application to the growth of gallium arsenide (GaAs) by metal- organic chemical vapor deposition, the dependence of surface morphology and hillock formation on crystal orientation, AsH3/TMG ratio, and oxide contamination was investigated. Layers of GaAs were deposited on undoped liquid- encapsulated Czochralski (LEC) GaAs substrates oriented either (100) or (100)+ 2 deg yields . Substrate orientation was checked by Laue X-ray diffraction. Surface features were observed by phjase contrast ... |
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