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Electronics and FluidicsElectrical and Electronic Equipment

Scanning Tunneling Microscopy of Semiconductor Surfaces

Authors: C. F. Quate; J. Nogami; STANFORD UNIV CA EDWARD L GINZTON LAB OF PHYSICS
Abstract:
This is a summary of results from a program aimed at studying the atomic structure of semiconductor surfaces using scanning tunneling microscopy (STM). The bulk of the research concerned the epitaxial growth of metals on the (111) and the (100) surfaces of silicon, with particular emphasis on the metals indium and gallium. The STM images provided structural information on all of the metal-induced surface reconstructions in these systems as well as information on the general behavior of the metals on the Si surface, yielding insight into metal mobility, the effect of stepped substrates, and the nucleation of metal growth on the surface. In addition to the semiconductor surface work, there has been some studies of the epitaxial growth of metals on Au(111), and the surface structure of the high temperature superconductor Bi2Sr2CaCu2O8+8. Keywords: Semiconductor surfaces, Scanning tunneling microscopy, Silicon, Metal surfaces, Epitaxial growth, Superconductors. (JES)

Limitations: APPROVED FOR PUBLIC RELEASE
Description: Final rept. 1 Apr 87-30 Sep 89
Pages: 12
Report Date: MAY 90
Contract Number: N00014-87-K-0679
Report Number: A933322
Keywords relating to this report:
ATOMIC STRUCTURE
EPITAXIAL GROWTH
GALLIUM
GROWTH(GENERAL)
INDIUM
METALS
MICROSCOPY
MOBILITY
NUCLEATION
SCANNING
SEMICONDUCTORS
SILICON
STRUCTURAL PROPERTIES
SUBSTRATES
SUPERCONDUCTORS
SURFACES
TUNNELING
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