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Abstract:
The cryostat for in situ investigation of the optical and electrical properties of amorphous materials has been built and preliminary tests are now being made. This coupled with an ion pump vacuum system is expected to provide much needed information on the intrinsic nature of amorphous materials evaporated under controlled conditions. An optical system for measuring the incident, transmitted, and reflected beam is also completed and tested. Work on the optical and electrical properties of amorphous silicon have been continued with improved precision. (Author)
| Description: |
Semi-annual technical rept. |
| Pages: |
5 |
| Report Date: |
31 DEC 1971 |
| Contract Number: |
DAAROD3112471G134, ARPAOrder15 |
| Report Number: |
0805637 |
Report Unavailable |
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