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Optics and AcousticsAcoustooptic and Optoacoustic Devices

Joint Services Electronics Program. Appendix

Authors: D. M. Bloom; R. L. Byer; G. S. Kino; C. F. Quate; H. J. Shaw; STANFORD UNIV CA EDWARD L GINZTON LAB OF PHYSICS
Abstract:
Partial contents: Optical detection of charge modulation in silicon integrated circuits using a laser diode probe; Observation of dislocations in graphite by scanning tunneling microscopy (STM); Atomic resolution imaging of a nonconductor by atomic force microscopy; A real-time confocal scanning optical microscope; Switchable fiber optic using the acousto-optic bragg interaction and using acoustic transducers deposited upon the fiber surface; All-fiber-optic gyroscopes; Deposition of piezoelectric films on single mode fibers and applications to fiber modulators; Optical sensors for range and depth measurements; Images of a lipid bilayer at molecular resolution by STM; Real time digital signals in a silicon bipolar junction transistor using a noninvasive optical probe; Anomalous distance dependence in STM; Monolithic Nd:YAG fiber laser; Optical interactions with solids; Noninvasive sheet charge density probe for integrated silicon devices; Deposition of oriented zinc oxide on an optical fiber; Low loss single crystal sapphire optical fibers; Electrooptic sampling in GaAS integrated circuits; A guided wave monolithic resonator ruby fiber laser; Tunneling microscopy from 300 to 4.2k; Characterization of proton exchanged waveguides in MgO:LiNbO (sub) 3; High speed, High resolution fiber diameter measurement system.

Description: Annual progress rept. 1 Apr 86-31 Mar 87
Pages: 213
Report Date: 15 OCT 87
Contract Number: N00014-84-K-0327
Report Number: A341981

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Keywords relating to this report:
ACOUSTOOPTICS
ANOMALIES
ATOMIC PROPERTIES
BIPOLAR TRANSISTORS
BRAGG ANGLE
DEPOSITION
DEPTH
DIGITAL SYSTEMS
DIODES
DISLOCATIONS
ELECTROACOUSTIC TRANSDUCERS
ELECTROOPTICS
FIBER OPTICS
FIBERS
FILMS
GALLIUM ARSENIDES
GRAPHITE
IMAGES
INTEGRATED CIRCUITS
INTEGRATED SYSTEMS
INTERACTIONS
JUNCTION TRANSISTORS
LASERS
MEASUREMENT
MICROSCOPY
MODULATORS
MOLECULES
OBSERVATION
OPTICAL DETECTION
OPTICAL DETECTORS
OPTICAL EQUIPMENT
OPTICAL PROPERTIES
PIEZOELECTRIC MATERIALS
PROBES
Range Distance
REAL TIME
RESOLUTION
SAMPLING
SCANNING
SIGNALS
SILICON
SOLIDS
SURFACES
TUNNELING
YAG LASERS
ZINC OXIDES.
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