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Analytical Techniques for Materials Surface Characterization,
Authors: S. M. Lee |
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Abstract:
Instrumental analytical techniques including: ESCA, SEM, SIMS, ISS and UPS for characterizing the surface properties of materials are discussed. Photons, electrons, atoms, molecules or ions can be used as probes in a variety of combinations and in an imposing array of analytical instrumentations. Each surface analytical technique is unique with its own capabilities and corresponding specificity. (Author, modified).
| Pages: |
15 |
| Report Date: |
13 OCT 1981 |
| Report Number: |
D338534 |
Report Unavailable |
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