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Abstract:
The purpose of this basic research effort was to develop a systematic approach to determining radiation sensitivity in organic semiconductor based devices, including particularly photo-voltaics but also evaluating and characterizing organic based diodes, transistors including field effect devices and basic structures. The scope of the effort included both an experimental component that included application of accelerated testing with both ionizing radiation and elevated temperatures, as well as a modeling component to understand and confirm degradation mechanisms. The findings included the discovery that carrier lifetimes were unaffected by ionizing radiation but degradation manifested itself in the development of an internal potential that tended to reduce efficiency of the organic photovoltaic devices tested. This conclusion, along with any recommendations, will be utilized by device fabricators to attempt a mitigation scheme.
| Limitations: |
 APPROVED FOR PUBLIC RELEASE |
| Description: |
Final rept. 1 Oct 2003-1 Jan 2012 |
| Pages: |
20 |
| Report Date: |
04 Apr 2012 |
| Report Number: |
A109955 |
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