The initial objective of acquiring instrumentation to allow microscopic tribological measurements to be made with atomic force microscopy as a function of temperature has been fully realized. This objective has been attained through the design and construction of a multi-chamber UHV surface analysis system, the design and construction of a sample transfer and manipulation hardware, and the design, installation and testing of a variable temperature, UHV, contact mode AFM. Experiments are now underway exploring the temperature dependence of fundamental tribological contacts.
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